摘 要：原子力显微镜以其分辨率高、样品无需特殊制备、实验可在大气环境中进行等优点而广泛应用于聚合物研究之中，弥补扫描隧道显微镜不能观测非导电样品的缺憾。近年来，其应用已由对聚合物表面几何形貌的观测发展到纳米级结构和表面性能的研究领域。在介绍原子力显微镜工作原理的基础上，简要回顾其在聚合物研究方面的若干新应用，并对其应用前景作展望。
Abstract：Atomic force microscope(AFM) is a new type of microscope based on the principle of scanNIng tunneling microscope.Owing to its many advantages,it has become a powerful technique in polymer field such as the characterization of the surface morphology and properties,the visualization of phase separation,and the investigation of polymer on nanometer scale.In this mini-review,the basic principle of AFM and its application in polymer study are given briefly.
